Aurore Andrieux

2019 (1)

• article - An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer
  Sensors (Volume 19, Issue (4), feb 2019, Pages :6)
  Bargiel, Sylwester | Andrieux, Aurore | Gorecki, Christophe | Zarzycki, Artur | Galeano Zea, July Andrea
  
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