Patrice Salzenstein

Dr. Patrice Salzenstein holds a PhD in Electronics, University of Sciences and Technologies of Lille (USTL'96), a Master of Research degree and a Graduate Engineering school degree (Lille, Eudil'93). Between 1996 and 2001 he worked near Paris, France, at Thomson CSF LCR (now Thales-TRT), Alcatel Alsthom Recherche, LCIE private research laboratories. He managed a calibration laboratory (phase noise and short term stability of frequency) between 2002 and the beginning of 2012. He has been working since 2001 for CNRS, a government-funded research organization under administrative authority of France's Ministry of research, at FEMTO-ST institute in Besancon, in Electronic Engineering domain. In 2010, one of his articles was featured in Electronics Letters for his participation with Czech and Swiss colleagues to the best frequency stability ever measured on a quartz crystal oscillator: 2.5×10-14 at 5 MHz [5]. Between 2010 and recently, his fields of interest in research were for optoelectronic resonators and oscillators for microwaves photonics applications. He is now the deputy head of the Phononic & Microscopy team, at the Micro Nano Science & Systems department of CNRS UMR 6174 FEMTO-ST laboratory, with an interest in uncertainty estimations [1-4]. Dr. Salzenstein has published over 115 papers in various international peer review journals and international conferences.

5 chosen publications:

[1] Salzenstein P., Wu T. Y., "Uncertainty estimation for the Brillouin frequency shift measurement using a scanning tandem Fabry-Pérot interferometer," Micromachines 14(7), 1429 (2023). https://doi.org/10.3390/mi14071429

[2] Salzenstein P., Pavlyuchenko E., "Uncertainty Evaluation on a 10.52 GHz (5 dBm) Optoelectronic Oscillator Phase Noise Performance," Micromachines 12(5), 474 (2021). https://doi.org/10.3390/mi12050474

[3] Salzenstein P., Wu T. Y., "Uncertainty analysis for a phase-detector based phase noise measurement system," Measurement 85, 118–123 (2016). http://dx.doi.org/10.1016/j.measurement.2016.02.026

[4] Salzenstein P., Pavlyuchenko E., Hmima A., Cholley N., Zarubin M., Galliou S., Chembo Y. K. and Larger L., "Estimation of the uncertainty for a phase noise optoelectronic metrology system," Physica Scripta T 149, 014025 (2012). http://dx.doi.org/10.1088/0031-8949/2012/T149/014025

[5] Salzenstein P., Kuna A., Sojdr L. and Chauvin J. "Significant step in ultra high stability quartz crystal oscillators," Electronics Letters 46(21), 1433–1434, (2010). http://dx.doi.org/10.1049/el.2010.1828 – Featured in Electronics Letters. https://digital-library.theiet.org/deliver/fulltext/el/46/21/20109123.pdf

IDs:

ORCID: 0000-0003-0207-5279

Google scholar: https://scholar.google.com/citations?user=PG8sc4QAAAAJ

Scopus Author ID: 6505939060

ResearcherID: D-4692-2011

SciProfiles: 118364

Loop profile: 1581125