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Atomic Force Microscope (AFM)

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Atomic Force Microscope (AFM)

Scanning probe / Atomic Force Microscopy (Multimode SPM)
Nanoscope Software version 5



Contact :

Céline ELIE-CAILLE
TEMIS Sciences Building
03 63 08 24 52 (Office)
celine.caille@femto-st.fr


Location :

TEMIS Sciences Building
AFM room




Principle :

The MultiMode tool allows 1) to characterize the topography of biological samples at the nanometer scale (Imaging mode) and 2) to measure the interaction forces between two molecules (Spectroscopic forces mode).



Several
imaging modes are available including contact and intermittent contact modes (tapping) that are the most frequently used on this equipment. This latter method is obtained by oscillation of the lever at its resonant frequency.



This equipment will also offer the opportunity to work in a liquid environment through the use of a fluidic cell (see figure below). In the case of observation of biological samples, this tool allows to work in physiological conditions (buffered medium, salts, etc ....).



Technical characteristics :

- SPM MultiMode head
- Scanners : 7411EV and 1306J


Description of  the scanners :



- Noise : < 0.3 Å RMS
- Sample size: diameter 15 mm; thickness ≤ 5 mm



- Lever holders :


Tapping mode/contact mode in air (std); (available at Institut Femto-st)
Tapping mode/force modulation in fluid (optional); (available at Institut Femto-st)
Force modulation in air (optional); electrical field (optional)
STM converter (optional)
Low-current STM converter (optional); contact mode fluid cell (optional)
Electrochemistry AFM or STM fluid cell (optional)
Electrochemistry tapping mode fluid cell (optional)
TRmode (optional)

- Vibrational and acoustic insulation :

Anti-vibration table
Foam bell



Achieved results :

Micro/nano-etched substrates:



Biointerfaces :